Optimization of Repetition Parameters For ABCD3T Chip Analogue Tests

For the purpose of reducing the testing time of the ABCD3T chip wafers for the ATLAS SCT, we need to optimize the values of the repetition parameters and the sequence of tests involved in both analogue and digital measurements of the chip. In this note we describe the study for the optimization of t...

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Detalles Bibliográficos
Autores principales: Flacco, C J, Ciocio, A, Fadeev, V
Lenguaje:eng
Publicado: 2001
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/684274

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