A Protection Scheme for the Calibration Resistive Networks

The High Voltage discharge incidents during the test of the LAr barrel modules at Saclay damaged several of the calibration resistive networks on the Mother Boards. This effect was reproducible in a controlled test-bench environment. Bench tests have demonstrated that an energy discharge of 120 mJ i...

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Detalles Bibliográficos
Autores principales: Berny, F, Fournier, D, Lanni, F, Lissauer, D, Premisler, L, Puzo, P, Radeka, V, Rajagopalan, S, Rescia, S
Lenguaje:eng
Publicado: 2002
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/685416

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