Techniques for the Measurement of Common Mode Noise in Binary Read Out Systems

Methods have been developed to measure the amount of common mode noise present in binary read-out systems. It is demonstrated how the correlation in the occupancies of groups of channels provides a measure of the magnitude of the common mode noise they are susceptible to. At high thresholds the occupancy per event is found to yield a more sensitive test for common mode noise. The functionality of the methods is demonstrated by application to the ATLAS SCT silicon microstrip detectors