Charge collection with binary readout from a test beam perspective

Some aspects of charge collection in the binary readout scheme are discussed in the light of beam test results of recent SCT prototypes

Detalles Bibliográficos
Autores principales: Vos, M A, Bernabeu, J, Dolezal, Z, García-Navarro, J E, Kodys, P, Moorhead, G F, D'Onofrio, M, Reznicek, P
Lenguaje:eng
Publicado: 2003
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/685474

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