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Optimising the Grouping of SCT Wafers into Readout Buffers using Simulated Annealing Methods
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
1996
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/685776 |
_version_ | 1780901575330365440 |
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author | Charlton, VA |
author_facet | Charlton, VA |
author_sort | Charlton, VA |
collection | CERN |
id | cern-685776 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1996 |
record_format | invenio |
spelling | cern-6857762019-09-30T06:29:59Zhttp://cds.cern.ch/record/685776engCharlton, VAOptimising the Grouping of SCT Wafers into Readout Buffers using Simulated Annealing MethodsDetectors and Experimental TechniquesATL-DAQ-96-057ATL-D-PN-57oai:cds.cern.ch:6857761996-09-17 |
spellingShingle | Detectors and Experimental Techniques Charlton, VA Optimising the Grouping of SCT Wafers into Readout Buffers using Simulated Annealing Methods |
title | Optimising the Grouping of SCT Wafers into Readout Buffers using Simulated Annealing Methods |
title_full | Optimising the Grouping of SCT Wafers into Readout Buffers using Simulated Annealing Methods |
title_fullStr | Optimising the Grouping of SCT Wafers into Readout Buffers using Simulated Annealing Methods |
title_full_unstemmed | Optimising the Grouping of SCT Wafers into Readout Buffers using Simulated Annealing Methods |
title_short | Optimising the Grouping of SCT Wafers into Readout Buffers using Simulated Annealing Methods |
title_sort | optimising the grouping of sct wafers into readout buffers using simulated annealing methods |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/685776 |
work_keys_str_mv | AT charltonva optimisingthegroupingofsctwafersintoreadoutbuffersusingsimulatedannealingmethods |