Determination of Leakage Currents and Depletion Voltages of Pixel Test Structures

Detalles Bibliográficos
Autores principales: Gorfine, G, Holland, S, Seidel, S
Lenguaje:eng
Publicado: 1996
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/685987
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author Gorfine, G
Holland, S
Seidel, S
author_facet Gorfine, G
Holland, S
Seidel, S
author_sort Gorfine, G
collection CERN
id cern-685987
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1996
record_format invenio
spelling cern-6859872019-09-30T06:29:59Zhttp://cds.cern.ch/record/685987engGorfine, GHolland, SSeidel, SDetermination of Leakage Currents and Depletion Voltages of Pixel Test StructuresDetectors and Experimental TechniquesATL-INDET-96-139ATL-I-PN-139oai:cds.cern.ch:6859871996-09-09
spellingShingle Detectors and Experimental Techniques
Gorfine, G
Holland, S
Seidel, S
Determination of Leakage Currents and Depletion Voltages of Pixel Test Structures
title Determination of Leakage Currents and Depletion Voltages of Pixel Test Structures
title_full Determination of Leakage Currents and Depletion Voltages of Pixel Test Structures
title_fullStr Determination of Leakage Currents and Depletion Voltages of Pixel Test Structures
title_full_unstemmed Determination of Leakage Currents and Depletion Voltages of Pixel Test Structures
title_short Determination of Leakage Currents and Depletion Voltages of Pixel Test Structures
title_sort determination of leakage currents and depletion voltages of pixel test structures
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/685987
work_keys_str_mv AT gorfineg determinationofleakagecurrentsanddepletionvoltagesofpixelteststructures
AT hollands determinationofleakagecurrentsanddepletionvoltagesofpixelteststructures
AT seidels determinationofleakagecurrentsanddepletionvoltagesofpixelteststructures

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