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Determination of Leakage Currents and Depletion Voltages of Pixel Test Structures

Detalles Bibliográficos
Autores principales:	Gorfine, G, Holland, S, Seidel, S
Lenguaje:	eng
Publicado:	1996
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/685987

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