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Pion Damage in Semiconductor Lasers

Fully packaged, edge-emitting 1310nm wavelength semiconductor lasers, for use in CMS Tracker optical links, have been irradiated at room temperature with 330MeV positive pions. Measurements of the threshold current and slope-efficiency were made in-situ for pion fluences up to 5.2x10 14 pi+/cm2. A c...

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Autores principales: Gill, Karl, Arbet-Engels, Vincent, Cervelli, Giovanni, Grabit, Robert, Mommaert, Chantal, Stefanini, Giorgio, Troska, Jan, Vasey, François
Lenguaje:eng
Publicado: 1998
Materias:
Acceso en línea:http://cds.cern.ch/record/686984
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author Gill, Karl
Arbet-Engels, Vincent
Cervelli, Giovanni
Grabit, Robert
Mommaert, Chantal
Stefanini, Giorgio
Troska, Jan
Vasey, François
author_facet Gill, Karl
Arbet-Engels, Vincent
Cervelli, Giovanni
Grabit, Robert
Mommaert, Chantal
Stefanini, Giorgio
Troska, Jan
Vasey, François
author_sort Gill, Karl
collection CERN
description Fully packaged, edge-emitting 1310nm wavelength semiconductor lasers, for use in CMS Tracker optical links, have been irradiated at room temperature with 330MeV positive pions. Measurements of the threshold current and slope-efficiency were made in-situ for pion fluences up to 5.2x10 14 pi+/cm2. A comparison is made between pion damage and neutron, proton and gamma damage in terms of the threshold current increase in the lasers. 330MeV pions are 1.2 times more damaging than 24GeV protons and 3.8 times more damaging than 6MeV neutrons; gamma damage is negligible in comparison to hadron damage. Around 40% of the pion damage anneals in 600 hours at room temperature following irradiation. Higher temperature annealing steps ( 300 hours at 40, 60 and 80 degree C) recover a further 25% of the damage, with no anti-annealing.
id cern-686984
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1998
record_format invenio
spelling cern-6869842019-09-30T06:29:59Zhttp://cds.cern.ch/record/686984engGill, KarlArbet-Engels, VincentCervelli, GiovanniGrabit, RobertMommaert, ChantalStefanini, GiorgioTroska, JanVasey, FrançoisPion Damage in Semiconductor LasersDetectors and Experimental TechniquesFully packaged, edge-emitting 1310nm wavelength semiconductor lasers, for use in CMS Tracker optical links, have been irradiated at room temperature with 330MeV positive pions. Measurements of the threshold current and slope-efficiency were made in-situ for pion fluences up to 5.2x10 14 pi+/cm2. A comparison is made between pion damage and neutron, proton and gamma damage in terms of the threshold current increase in the lasers. 330MeV pions are 1.2 times more damaging than 24GeV protons and 3.8 times more damaging than 6MeV neutrons; gamma damage is negligible in comparison to hadron damage. Around 40% of the pion damage anneals in 600 hours at room temperature following irradiation. Higher temperature annealing steps ( 300 hours at 40, 60 and 80 degree C) recover a further 25% of the damage, with no anti-annealing.CMS-NOTE-1998-046oai:cds.cern.ch:6869841998-07-31
spellingShingle Detectors and Experimental Techniques
Gill, Karl
Arbet-Engels, Vincent
Cervelli, Giovanni
Grabit, Robert
Mommaert, Chantal
Stefanini, Giorgio
Troska, Jan
Vasey, François
Pion Damage in Semiconductor Lasers
title Pion Damage in Semiconductor Lasers
title_full Pion Damage in Semiconductor Lasers
title_fullStr Pion Damage in Semiconductor Lasers
title_full_unstemmed Pion Damage in Semiconductor Lasers
title_short Pion Damage in Semiconductor Lasers
title_sort pion damage in semiconductor lasers
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/686984
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