Cargando…
The Effect of Highly Ionising Events on the APV25 Readout Chip
Inelastic nuclear interactions in silicon sensors can produce highly ionising particles, which in turn can generate signals equivalent of up to >>1000 minimum ionising particles. These highly ionising events have been observed to cause measurable deadtime in the CMS Tracker APV25 front...
Autores principales: | Bainbridge, Robert, Chierici, Roberto, Hall, Geoffrey, Mirabito, Laurent, Raymond, M |
---|---|
Lenguaje: | eng |
Publicado: |
2002
|
Materias: | |
Acceso en línea: | http://cds.cern.ch/record/687456 |
Ejemplares similares
-
The effect of ionising events on the APV25 readout chip
por: Bainbridge, R J
Publicado: (2002) -
Influence of Highly Ionising Events on the CMS APV25 Readout Chip
por: Bainbridge, R J
Publicado: (2004) -
Single event upset studies on the APV25 front end readout chip
por: Fulcher, J R, et al.
Publicado: (2000) -
The APV25 025 mum CMOS readout chip for the CMS tracker
por: Raymond, M, et al.
Publicado: (2000) -
Response of the APV readout chip to laser-simulated, highly ionizing interactions
por: Bernardini, Jacopo, et al.
Publicado: (2004)