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Radiation Effects on Breakdown Characteristics of Multi Guarded Devices
Multiguard structures are used in order to enhance the breakdown voltage of microstrip detectors. In this work we studied the electrical properties of devices designed in four different layouts on n-Si substrates, based on a central diode surrounded by various p+ and/or n+ floating rings. In particu...
Autores principales: | Da Rold, M, Bacchetta, N, Bisello, D, Candelori, A, Da Re, A, Dalla Betta, Gian Franco, Paccagnella, A, Soncini, G, Verzellesi, G, Wheadon, R |
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Lenguaje: | eng |
Publicado: |
1997
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/687569 |
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