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First Evaluation of the Single Event Upset (SEU) Risk for Electronics in the CMS Experiment
SEU error rates in the CMS tracker environment have been approximated with Monte Carlo simulations. The estimated upset rates for a submicron technology are 8.3 10-7 upsets/( bit s) at 4.9cm and 1.1 10-8 upsets/( bit s) at 49cm from the beam line, respectively. Comparison of simulation data with exp...
Autores principales: | , , |
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Lenguaje: | eng |
Publicado: |
1998
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/687587 |