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Test-Beam Analysis of the Effect of Highly Ionising Particles on the Silicon Strip Tracker
Highly Ionizing Particles (HIPs) created by nuclear interactions in the tracker sensors produce large signals which can momentarily saturate an APV readout chip. This phenomenon is studied in two different beam-tests performed at PSI and X5 in 2002. The probability of a HIP-like event occurring per...
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| Lenguaje: | eng |
| Publicado: |
2003
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| Acceso en línea: | http://cds.cern.ch/record/687851 |