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A detailed study of charge diffusion and its effect on spatial resolution in Silicon Drift Detectors, pt.2

Detalles Bibliográficos
Autores principales:	Nouais, D, Cerello, P G
Lenguaje:	eng
Publicado:	2001
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/689047

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