In-Beam Test of Double-Sided Silicon Strip Detector

The response of a double-sided silicon strip detector to a 3 GeV pion beam from the Proton Synchrotron at CERN is presented. Charge matching between the pulseheights from both sides, produced by the same traversing particle, is obtained with a resolution better than 5%. The spatial resolution is measured as a function of the incident angle of the projectile varying from 15&micro;m at normal incidence to 32&micro;m at 45&deg;. The contribution of multiple scattering to the spatial resolution is estimated to 11&micro;m. <P> List of Figures <BR> <UL> <LI>Figure 1:<A HREF="setup_bw.eps">The detector telescope used in the pion beam tests. </A> <LI>Figure 2:<A HREF="charge_m.eps">Distribution of the cluster pulseheights measured on the p-side versus the ones on the n-side for the same transversing particles. </A> <LI>Figure 3:<A HREF="ch_m_noise.eps">Noise distributions for clusteres of (a)p-side and (b)n-side of the tested double-side silicon strip detector. </A> <LI> Figure 4:<A HREF="ch_m_error2.eps">Distribution of deviations of the pulseheight values from the line. </A> <LI> Figure 5:<A HREF="res_ref.eps">Residual distribution of the reference detector 4X. </A> <LI>Figure 6:<A HREF="pul_height.eps">Cluster pulseheight of p-side of the tested DS silicon strip detector for tracks with normal incidence. </A> <LI>Figure 7:<A HREF="angle.eps">Correlation between the mean cluster pulseheight (points and squares) and the track length in the silicon which is proportional to 1/<I>cos&Oslash;</I>. </A> <LI> Figure 8:<A HREF="res_test.eps">Residual distributions of p-side of the tested DS silicon strip detector for (a)normal (0&deg;) and (b)45&deg; inclined tracks. </A> <LI> Figure 9:<A HREF="simu_m_sc.eps">Simulated distribution of a 3 GeV pion beam divergence in the used test setup. </A> </UL>