Total dose effects on ATLAS-SCT front-end electronics

Low dose rate effects (LDRE) in bipolar technologies complicate the hardness assurance testing for high energy physics applications. The damage produced in the ICs in the real experiment can be underestimated if fast irradiations are carried out, while experiments done at the real dose rate are usua...

Descripción completa

Detalles Bibliográficos
Autores principales: Ullán, M, Dorfan, D, Dubbs, T, Grillo, A A, Spencer, E, Seiden, A, Spieler, H, Gilchriese, M G D, Lozano, M
Lenguaje:eng
Publicado: 2002
Materias:
Health Physics and Radiation Effects
Acceso en línea:http://cds.cern.ch/record/705957
Descripción
Sumario:Low dose rate effects (LDRE) in bipolar technologies complicate the hardness assurance testing for high energy physics applications. The damage produced in the ICs in the real experiment can be underestimated if fast irradiations are carried out, while experiments done at the real dose rate are usually unpractical due to the still high total doses involved. In this work the sensitivity to LDRE of two bipolar technologies proposed for the ATLAS-SCT experiment at CERN is evaluated, finding one of them free of those effects. (12 refs).

Ejemplares similares