Cryogenic Testing of High Current By-pass Diode Stacks for the Protection of the Superconducting Magnets in the LHC

For the protection of the LHC superconducting magnets, about 2100 specially developed by-pass diodes were manufactured by DYNEX SEMICONDUCTOR LTD (Lincoln, GB) and about 1300 of these diodes were mounted into diode stacks and submitted to tests at cryogenic temperatures. To date about 800 dipole dio...

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Autores principales: Brown, D, Della Corte, A, Fiamozzi-Zignani, C, Gharib, A, Hagedorn, Dietrich, Rout, C, Turtu, S
Lenguaje:eng
Publicado: 2004
Materias:
Accelerators and Storage Rings
Acceso en línea:https://dx.doi.org/10.1063/1.1774639
http://cds.cern.ch/record/709119
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author Brown, D
Della Corte, A
Fiamozzi-Zignani, C
Gharib, A
Hagedorn, Dietrich
Rout, C
Turtu, S
author_facet Brown, D
Della Corte, A
Fiamozzi-Zignani, C
Gharib, A
Hagedorn, Dietrich
Rout, C
Turtu, S
author_sort Brown, D
collection CERN
description For the protection of the LHC superconducting magnets, about 2100 specially developed by-pass diodes were manufactured by DYNEX SEMICONDUCTOR LTD (Lincoln, GB) and about 1300 of these diodes were mounted into diode stacks and submitted to tests at cryogenic temperatures. To date about 800 dipole diode stacks and about 250 quadrupole diode stacks for the protection of the superconducting lattice dipole and lattice quadrupole magnets have been assembled at OCEM (Bologna,Italy) and successfully tested in liquid helium at ENEA (Frascati, Italy). This report gives an overview of the test results obtained so far. After a short description of the test installations and test procedures, a statistical analysis is presented for test data during diode production as well as for the performance of the diode stacks during testing in liquid helium, including failure rates and degradation of the diodes.
id cern-709119
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2004
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spelling cern-7091192023-05-31T13:22:42Zdoi:10.1063/1.1774639http://cds.cern.ch/record/709119engBrown, DDella Corte, AFiamozzi-Zignani, CGharib, AHagedorn, DietrichRout, CTurtu, SCryogenic Testing of High Current By-pass Diode Stacks for the Protection of the Superconducting Magnets in the LHCAccelerators and Storage RingsFor the protection of the LHC superconducting magnets, about 2100 specially developed by-pass diodes were manufactured by DYNEX SEMICONDUCTOR LTD (Lincoln, GB) and about 1300 of these diodes were mounted into diode stacks and submitted to tests at cryogenic temperatures. To date about 800 dipole diode stacks and about 250 quadrupole diode stacks for the protection of the superconducting lattice dipole and lattice quadrupole magnets have been assembled at OCEM (Bologna,Italy) and successfully tested in liquid helium at ENEA (Frascati, Italy). This report gives an overview of the test results obtained so far. After a short description of the test installations and test procedures, a statistical analysis is presented for test data during diode production as well as for the performance of the diode stacks during testing in liquid helium, including failure rates and degradation of the diodes.LHC-Project-Report-686CERN-LHC-Project-Report-686oai:cds.cern.ch:7091192004-01-29
spellingShingle Accelerators and Storage Rings
Brown, D
Della Corte, A
Fiamozzi-Zignani, C
Gharib, A
Hagedorn, Dietrich
Rout, C
Turtu, S
Cryogenic Testing of High Current By-pass Diode Stacks for the Protection of the Superconducting Magnets in the LHC
title Cryogenic Testing of High Current By-pass Diode Stacks for the Protection of the Superconducting Magnets in the LHC
title_full Cryogenic Testing of High Current By-pass Diode Stacks for the Protection of the Superconducting Magnets in the LHC
title_fullStr Cryogenic Testing of High Current By-pass Diode Stacks for the Protection of the Superconducting Magnets in the LHC
title_full_unstemmed Cryogenic Testing of High Current By-pass Diode Stacks for the Protection of the Superconducting Magnets in the LHC
title_short Cryogenic Testing of High Current By-pass Diode Stacks for the Protection of the Superconducting Magnets in the LHC
title_sort cryogenic testing of high current by-pass diode stacks for the protection of the superconducting magnets in the lhc
topic Accelerators and Storage Rings
url https://dx.doi.org/10.1063/1.1774639
http://cds.cern.ch/record/709119
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