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The charge collection in single side silicon microstrip detectors

The transient current technique has been used to investigate signal formation in unirradiated silicon microstrip detectors, which are similar in geometry to those developed for the ATLAS experiment at LHC. Nanosecond pulsed infrared and red lasers were used to induce the signals under study. Two pec...

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Detalles Bibliográficos
Autores principales: Eremin, V V, Böhm, J, Roe, S, Ruggiero, G, Weilhammer, Peter
Lenguaje:eng
Publicado: 2003
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(03)00330-9
http://cds.cern.ch/record/710586
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author Eremin, V V
Böhm, J
Roe, S
Ruggiero, G
Weilhammer, Peter
author_facet Eremin, V V
Böhm, J
Roe, S
Ruggiero, G
Weilhammer, Peter
author_sort Eremin, V V
collection CERN
description The transient current technique has been used to investigate signal formation in unirradiated silicon microstrip detectors, which are similar in geometry to those developed for the ATLAS experiment at LHC. Nanosecond pulsed infrared and red lasers were used to induce the signals under study. Two peculiarities in the detector performance were observed: an unexpectedly slow rise to the signal induced in a given strip when signals are injected opposite to the strip, and a long duration of the induced signal in comparison with the calculated drift time of charge carriers through the detector thickness - with a significant fraction of the charge being induced after charge carrier arrival. These major effects and details of the detector response for different positions of charge injection are discussed in the context of Ramo's theorem and compared with predictions arising from the more commonly studied phenomenon of signal formation in planar pad detectors.
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institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2003
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spelling cern-7105862019-09-30T06:29:59Zdoi:10.1016/S0168-9002(03)00330-9http://cds.cern.ch/record/710586engEremin, V VBöhm, JRoe, SRuggiero, GWeilhammer, PeterThe charge collection in single side silicon microstrip detectorsDetectors and Experimental TechniquesThe transient current technique has been used to investigate signal formation in unirradiated silicon microstrip detectors, which are similar in geometry to those developed for the ATLAS experiment at LHC. Nanosecond pulsed infrared and red lasers were used to induce the signals under study. Two peculiarities in the detector performance were observed: an unexpectedly slow rise to the signal induced in a given strip when signals are injected opposite to the strip, and a long duration of the induced signal in comparison with the calculated drift time of charge carriers through the detector thickness - with a significant fraction of the charge being induced after charge carrier arrival. These major effects and details of the detector response for different positions of charge injection are discussed in the context of Ramo's theorem and compared with predictions arising from the more commonly studied phenomenon of signal formation in planar pad detectors.oai:cds.cern.ch:7105862003
spellingShingle Detectors and Experimental Techniques
Eremin, V V
Böhm, J
Roe, S
Ruggiero, G
Weilhammer, Peter
The charge collection in single side silicon microstrip detectors
title The charge collection in single side silicon microstrip detectors
title_full The charge collection in single side silicon microstrip detectors
title_fullStr The charge collection in single side silicon microstrip detectors
title_full_unstemmed The charge collection in single side silicon microstrip detectors
title_short The charge collection in single side silicon microstrip detectors
title_sort charge collection in single side silicon microstrip detectors
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/S0168-9002(03)00330-9
http://cds.cern.ch/record/710586
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