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Production Testing of ATLAS MDT Front-End Electronics
Autores principales: | Hazen, E, Posch, C, Kirsch, L, Brandenburg, G, Nudell, M, Oliver, J |
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Lenguaje: | eng |
Publicado: |
CERN
2003
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.5170/CERN-2003-006.297 http://cds.cern.ch/record/722070 |
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