Noise measurements on Si sensors

Developing silicon strip sensors for the CMS Preshower detector we have noticed that some strips have a noise higher than the average and not correlated to a high leakage current. In order to investigate this effect we have developed a set-up for noise measurement on wafers and diced sensors that do...

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Detalles Bibliográficos
Autores principales: Peisert, Anna, Evangelou, I, Kokkas, P, Manthos, N, Prouskas, C, Triantis, F A, Tzoulis, N, Aspell, P, Barney, D, Bloch, P, Kloukinas, K, Reynaud, S, Go, A, Elsha, V, Zubarev, E
Lenguaje:eng
Publicado: 2002
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(02)01556-5
http://cds.cern.ch/record/722137
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author Peisert, Anna
Evangelou, I
Kokkas, P
Manthos, N
Prouskas, C
Triantis, F A
Tzoulis, N
Aspell, P
Barney, D
Bloch, P
Kloukinas, K
Reynaud, S
Go, A
Elsha, V
Zubarev, E
author_facet Peisert, Anna
Evangelou, I
Kokkas, P
Manthos, N
Prouskas, C
Triantis, F A
Tzoulis, N
Aspell, P
Barney, D
Bloch, P
Kloukinas, K
Reynaud, S
Go, A
Elsha, V
Zubarev, E
author_sort Peisert, Anna
collection CERN
description Developing silicon strip sensors for the CMS Preshower detector we have noticed that some strips have a noise higher than the average and not correlated to a high leakage current. In order to investigate this effect we have developed a set-up for noise measurement on wafers and diced sensors that does not require bonding. The set-up is based on the DeltaStream chip coupled to a probe card. We have tested 45 sensors and found that the strips with an above average noise have a higher relative current increase as a function of voltage, DeltaI /(IDeltaV). We also observed that, on these strips, the breakdown occurs within about 60 V from the voltage at which the noise is observed. We describe our measurement method and present the results.
id cern-722137
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2002
record_format invenio
spelling cern-7221372019-09-30T06:29:59Zdoi:10.1016/S0168-9002(02)01556-5http://cds.cern.ch/record/722137engPeisert, AnnaEvangelou, IKokkas, PManthos, NProuskas, CTriantis, F ATzoulis, NAspell, PBarney, DBloch, PKloukinas, KReynaud, SGo, AElsha, VZubarev, ENoise measurements on Si sensorsDetectors and Experimental TechniquesDeveloping silicon strip sensors for the CMS Preshower detector we have noticed that some strips have a noise higher than the average and not correlated to a high leakage current. In order to investigate this effect we have developed a set-up for noise measurement on wafers and diced sensors that does not require bonding. The set-up is based on the DeltaStream chip coupled to a probe card. We have tested 45 sensors and found that the strips with an above average noise have a higher relative current increase as a function of voltage, DeltaI /(IDeltaV). We also observed that, on these strips, the breakdown occurs within about 60 V from the voltage at which the noise is observed. We describe our measurement method and present the results.oai:cds.cern.ch:7221372002
spellingShingle Detectors and Experimental Techniques
Peisert, Anna
Evangelou, I
Kokkas, P
Manthos, N
Prouskas, C
Triantis, F A
Tzoulis, N
Aspell, P
Barney, D
Bloch, P
Kloukinas, K
Reynaud, S
Go, A
Elsha, V
Zubarev, E
Noise measurements on Si sensors
title Noise measurements on Si sensors
title_full Noise measurements on Si sensors
title_fullStr Noise measurements on Si sensors
title_full_unstemmed Noise measurements on Si sensors
title_short Noise measurements on Si sensors
title_sort noise measurements on si sensors
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/S0168-9002(02)01556-5
http://cds.cern.ch/record/722137
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