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Beam loss induced electrical stress test on CMS silicon strip detectors
| Autores principales: | , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
CERN
2003
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.5170/CERN-2003-006.437 http://cds.cern.ch/record/722269 |
| _version_ | 1780903628571148288 |
|---|---|
| author | Weiler, T Dirkes, G Fahrer, M Hartmann, F Heier, S MacPherson, A Müller, T |
| author_facet | Weiler, T Dirkes, G Fahrer, M Hartmann, F Heier, S MacPherson, A Müller, T |
| author_sort | Weiler, T |
| collection | CERN |
| id | cern-722269 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2003 |
| publisher | CERN |
| record_format | invenio |
| spelling | cern-7222692019-09-30T06:29:59Zdoi:10.5170/CERN-2003-006.437http://cds.cern.ch/record/722269engWeiler, TDirkes, GFahrer, MHartmann, FHeier, SMacPherson, AMüller, TBeam loss induced electrical stress test on CMS silicon strip detectorsDetectors and Experimental TechniquesCERNoai:cds.cern.ch:7222692003 |
| spellingShingle | Detectors and Experimental Techniques Weiler, T Dirkes, G Fahrer, M Hartmann, F Heier, S MacPherson, A Müller, T Beam loss induced electrical stress test on CMS silicon strip detectors |
| title | Beam loss induced electrical stress test on CMS silicon strip detectors |
| title_full | Beam loss induced electrical stress test on CMS silicon strip detectors |
| title_fullStr | Beam loss induced electrical stress test on CMS silicon strip detectors |
| title_full_unstemmed | Beam loss induced electrical stress test on CMS silicon strip detectors |
| title_short | Beam loss induced electrical stress test on CMS silicon strip detectors |
| title_sort | beam loss induced electrical stress test on cms silicon strip detectors |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.5170/CERN-2003-006.437 http://cds.cern.ch/record/722269 |
| work_keys_str_mv | AT weilert beamlossinducedelectricalstresstestoncmssiliconstripdetectors AT dirkesg beamlossinducedelectricalstresstestoncmssiliconstripdetectors AT fahrerm beamlossinducedelectricalstresstestoncmssiliconstripdetectors AT hartmannf beamlossinducedelectricalstresstestoncmssiliconstripdetectors AT heiers beamlossinducedelectricalstresstestoncmssiliconstripdetectors AT macphersona beamlossinducedelectricalstresstestoncmssiliconstripdetectors AT mullert beamlossinducedelectricalstresstestoncmssiliconstripdetectors |