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First test measurements of a 64 k pixel readout chip working in single photon counting mode

The Medipix2 chip is a pixel detector readout chip consisting of 256 multiplied by 256 identical elements, each working in single photon counting mode for positive or negative input charge signals. The chip is designed and manufactured in a six-metal 0.25 mum CMOS technology. This paper describes se...

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Detalles Bibliográficos
Autores principales: Llopart-Cudie, Xavier, Campbell, M
Lenguaje:eng
Publicado: 2003
Materias:
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(03)01565-1
http://cds.cern.ch/record/725906
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author Llopart-Cudie, Xavier
Campbell, M
author_facet Llopart-Cudie, Xavier
Campbell, M
author_sort Llopart-Cudie, Xavier
collection CERN
description The Medipix2 chip is a pixel detector readout chip consisting of 256 multiplied by 256 identical elements, each working in single photon counting mode for positive or negative input charge signals. The chip is designed and manufactured in a six-metal 0.25 mum CMOS technology. This paper describes several electrical measurements which have been carried out on the chip prior to detector bump bonding using a dedicated readout system. Threshold linearity and variation has been measured for both electron and hole collection. The noise is similar to 100 e**- RMS and the threshold can be adjusted to similar to 120 e **- RMS for both polarities. The minimum operating threshold is similar to 1000 e**-.
id cern-725906
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2003
record_format invenio
spelling cern-7259062019-09-30T06:29:59Zdoi:10.1016/S0168-9002(03)01565-1http://cds.cern.ch/record/725906engLlopart-Cudie, XavierCampbell, MFirst test measurements of a 64 k pixel readout chip working in single photon counting modeDetectors and Experimental TechniquesThe Medipix2 chip is a pixel detector readout chip consisting of 256 multiplied by 256 identical elements, each working in single photon counting mode for positive or negative input charge signals. The chip is designed and manufactured in a six-metal 0.25 mum CMOS technology. This paper describes several electrical measurements which have been carried out on the chip prior to detector bump bonding using a dedicated readout system. Threshold linearity and variation has been measured for both electron and hole collection. The noise is similar to 100 e**- RMS and the threshold can be adjusted to similar to 120 e **- RMS for both polarities. The minimum operating threshold is similar to 1000 e**-.oai:cds.cern.ch:7259062003
spellingShingle Detectors and Experimental Techniques
Llopart-Cudie, Xavier
Campbell, M
First test measurements of a 64 k pixel readout chip working in single photon counting mode
title First test measurements of a 64 k pixel readout chip working in single photon counting mode
title_full First test measurements of a 64 k pixel readout chip working in single photon counting mode
title_fullStr First test measurements of a 64 k pixel readout chip working in single photon counting mode
title_full_unstemmed First test measurements of a 64 k pixel readout chip working in single photon counting mode
title_short First test measurements of a 64 k pixel readout chip working in single photon counting mode
title_sort first test measurements of a 64 k pixel readout chip working in single photon counting mode
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/S0168-9002(03)01565-1
http://cds.cern.ch/record/725906
work_keys_str_mv AT llopartcudiexavier firsttestmeasurementsofa64kpixelreadoutchipworkinginsinglephotoncountingmode
AT campbellm firsttestmeasurementsofa64kpixelreadoutchipworkinginsinglephotoncountingmode