Cryogenic semiconductor high-intensity radiation monitors

This paper describes a novel technique to monitor high-intensity particle beams by means of a semiconductor detector. It consists of cooling a semiconductor detector down to cryogenic temperature to suppress the thermally generated leakage current and to precisely measure the integrated ionization s...

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Detalles Bibliográficos
Autores principales: Palmieri, V G, Bell, W H, Borer, K, Casagrande, L, Da Vià, C, Devine, S R H, Dezillie, B, Esposito, A, Granata, V, Hauler, F, Jungermann, L, Li, Z, Lourenço, C, Niinikoski, T O, O'Shea, V
Lenguaje:eng
Publicado: 2003
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(03)01684-X
http://cds.cern.ch/record/726090

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