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Conference on Optical Metrology : Optical Measurement Systems for Industrial Inspection III
| Lenguaje: | eng |
|---|---|
| Publicado: |
2003
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/740259 |
| _version_ | 1780904057323388928 |
|---|---|
| collection | CERN |
| id | cern-740259 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2003 |
| record_format | invenio |
| spelling | cern-7402592020-12-18T13:01:27Zhttp://cds.cern.ch/record/740259engConference on Optical Metrology : Optical Measurement Systems for Industrial Inspection IIIOther Fields of Physicsoai:cds.cern.ch:7402592003 |
| spellingShingle | Other Fields of Physics Conference on Optical Metrology : Optical Measurement Systems for Industrial Inspection III |
| title | Conference on Optical Metrology : Optical Measurement Systems for Industrial Inspection III |
| title_full | Conference on Optical Metrology : Optical Measurement Systems for Industrial Inspection III |
| title_fullStr | Conference on Optical Metrology : Optical Measurement Systems for Industrial Inspection III |
| title_full_unstemmed | Conference on Optical Metrology : Optical Measurement Systems for Industrial Inspection III |
| title_short | Conference on Optical Metrology : Optical Measurement Systems for Industrial Inspection III |
| title_sort | conference on optical metrology : optical measurement systems for industrial inspection iii |
| topic | Other Fields of Physics |
| url | http://cds.cern.ch/record/740259 |