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Algorithm for preparation of multilayer systems with high critical angle of total reflection
The new development of theory of multilayer systems is presented. It shows precisely how to calculate thickness and number of layers to get reflectivity close to unity for a given, in principle, arbitrary critical angle. Application of the new approach to real systems is demonstrated
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
2002
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/747136 |