Cargando…
A study of radiation hardness screening techniques of integrated circuits
The principle and operational procedure of Integrated Circuits (ICs) screening with irradiation-and-anneal and multicomponent regression analysis are discussed. The key technology, advantages and shortcomings of the two methods are described in contrast, and some advices are given with the state-of-...
| Autor principal: | |
|---|---|
| Lenguaje: | chi |
| Publicado: |
2002
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/747265 |
| _version_ | 1780904157507485696 |
|---|---|
| author | Wang Xu Li |
| author_facet | Wang Xu Li |
| author_sort | Wang Xu Li |
| collection | CERN |
| description | The principle and operational procedure of Integrated Circuits (ICs) screening with irradiation-and-anneal and multicomponent regression analysis are discussed. The key technology, advantages and shortcomings of the two methods are described in contrast, and some advices are given with the state-of-the-art of the screening technology |
| id | cern-747265 |
| institution | Organización Europea para la Investigación Nuclear |
| language | chi |
| publishDate | 2002 |
| record_format | invenio |
| spelling | cern-7472652019-09-30T06:29:59Zhttp://cds.cern.ch/record/747265chiWang Xu LiA study of radiation hardness screening techniques of integrated circuitsDetectors and Experimental TechniquesThe principle and operational procedure of Integrated Circuits (ICs) screening with irradiation-and-anneal and multicomponent regression analysis are discussed. The key technology, advantages and shortcomings of the two methods are described in contrast, and some advices are given with the state-of-the-art of the screening technologyCAEP-0106oai:cds.cern.ch:7472652002 |
| spellingShingle | Detectors and Experimental Techniques Wang Xu Li A study of radiation hardness screening techniques of integrated circuits |
| title | A study of radiation hardness screening techniques of integrated circuits |
| title_full | A study of radiation hardness screening techniques of integrated circuits |
| title_fullStr | A study of radiation hardness screening techniques of integrated circuits |
| title_full_unstemmed | A study of radiation hardness screening techniques of integrated circuits |
| title_short | A study of radiation hardness screening techniques of integrated circuits |
| title_sort | study of radiation hardness screening techniques of integrated circuits |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/747265 |
| work_keys_str_mv | AT wangxuli astudyofradiationhardnessscreeningtechniquesofintegratedcircuits AT wangxuli studyofradiationhardnessscreeningtechniquesofintegratedcircuits |