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A study of radiation hardness screening techniques of integrated circuits
The principle and operational procedure of Integrated Circuits (ICs) screening with irradiation-and-anneal and multicomponent regression analysis are discussed. The key technology, advantages and shortcomings of the two methods are described in contrast, and some advices are given with the state-of-...
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| Lenguaje: | chi |
| Publicado: |
2002
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| Acceso en línea: | http://cds.cern.ch/record/747265 |