Characterization of geological materials using ion and photon beams.

Geological specimens are often complex materials that require different analytical methods for their characterization. The parameters of interest may include the chemical composition of major, minor and trace elements. The chemical compounds incorporated in the minerals, the crystal structure and isotopic composition need to be considered. Specimens may be highly heterogeneous thus necessitating analytical methods capable of measurements on small sample volumes with high spatial resolution and sensitivity. Much essential information on geological materials can be obtained by using ion or photon beams. In this chapter we describe the principal analytical techniques based on particle accelerators, showing some applications that are hardly possible with conventional methods. In particular, the following techniques will be discussed: (1) Synchrotron radiation (SR) induced X-ray emission (SRIXE) and particle-induced X-ray emission (PEE) and other ion beam techniques for trace element analysis. (2) Accelerator mass spectrometry (AMS) for ultra sensitive analysis of stable nuclides and long-lived radionuclides. In most of the cases also the possibilities of elemental and isotopic analysis with high resolution will be discussed.