Neutron-induced Single Event Upset on the RPC front-end chips for the CMS experiment

Neutrons from a reactor and from a cyclotron have been used to characterise the CMS Resistive Plate Chambers (RPCs) front-end chip to neutron-induced damaging events. Single Event Upset (SEU) cross-sections have been measured up to 60 MeV for different chip thresholds. Tests at a reactor were done w...

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Detalles Bibliográficos
Autores principales: Abbrescia, M, Altieri, S, Belli, G, Bruno, G, Colaleo, A, De Bari, A, Guida, R, Iaselli, G, Loddo, F, Maggi, M, Manera, S, Marangelli, B, Merlo, M, Natali, S, Nuzzo, S, Pugliese, G, Ranieri, A, Ratti, S P, Riccardi, C, Romano, F, Torre, P, Vitulo, P
Lenguaje:eng
Publicado: 2002
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(01)01967-2
http://cds.cern.ch/record/772054

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