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Progress Of Nb/Cu Technology With 1.5 GHz Cavities
The residual resistance of Nb/Cu cavities increases exponentially at high RF field. Two main possible causes have been investigated in detail: the hydrogen incorporated in the film during the sputtering process and the surface roughness induced by the substrate. The latter has been reduced with an o...
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
2003
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/791841 |
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