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Production Testing and Quality Assurance of CMS Silicon Microstrip Tracker Readout Chips

The APV25 is the 128 channel CMOS chip developed for readout of the silicon microstrip tracker in the CMS experiment at the CERN Large Hadron Collider. The detector is now under construction and will be the largest silicon microstrip system ever built, with ~200m^2 of silicon sensors. Around 10^5 ch...

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Autores principales: Barrillon, Pierre, Bainbridge, Robert, Hall, Geoffrey, Leaver, James, Noah, E, Raymond, M, Bisello, Dario, Candelori, Andrea, Kaminski, A, Stefanuti, L, Tessaro, Mario, French, Marcus
Lenguaje:eng
Publicado: CERN 2004
Materias:
Acceso en línea:https://dx.doi.org/10.5170/CERN-2004-010.148
http://cds.cern.ch/record/797704
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author Barrillon, Pierre
Bainbridge, Robert
Hall, Geoffrey
Leaver, James
Noah, E
Raymond, M
Bisello, Dario
Candelori, Andrea
Kaminski, A
Stefanuti, L
Tessaro, Mario
French, Marcus
author_facet Barrillon, Pierre
Bainbridge, Robert
Hall, Geoffrey
Leaver, James
Noah, E
Raymond, M
Bisello, Dario
Candelori, Andrea
Kaminski, A
Stefanuti, L
Tessaro, Mario
French, Marcus
author_sort Barrillon, Pierre
collection CERN
description The APV25 is the 128 channel CMOS chip developed for readout of the silicon microstrip tracker in the CMS experiment at the CERN Large Hadron Collider. The detector is now under construction and will be the largest silicon microstrip system ever built, with ~200m^2 of silicon sensors. Around 10^5 chips are required to instrument the system, which must operate for about 10 years in a high radiation environment with little or no possibility of microstrip system ever built, with ~200m^2 of silicon sensors. Around 10^5 chips are required to instrument the system, which must operate for about 10 years in a high radiation environment with little or no possibility of assurance of long term performance of the readout electronics, especially verification of radiation tolerance, is highly desirable. This has been achieved by means of automated probe testing of every chip on the silicon wafers from the foundry, followed by studies of sample die to evaluate in more detail properties of the chips which cannot easily be examined at the wafer level. During production, it was observed that the yield of good die varied unexpectedly from one production lot to another. This was investigated with significant help from the manufacturer and the process was optimised ensure a consistent high yield. A fraction of the dies, which successfully passed the wafer screening, are subjected to short term X-ray irradiation to levels equivalent to that expected in CMS and annealed. Results are presented here and illustrate the excellent performance of APV25 under all conditions.
id cern-797704
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2004
publisher CERN
record_format invenio
spelling cern-7977042019-09-30T06:29:59Zdoi:10.5170/CERN-2004-010.148http://cds.cern.ch/record/797704engBarrillon, PierreBainbridge, RobertHall, GeoffreyLeaver, JamesNoah, ERaymond, MBisello, DarioCandelori, AndreaKaminski, AStefanuti, LTessaro, MarioFrench, MarcusProduction Testing and Quality Assurance of CMS Silicon Microstrip Tracker Readout ChipsDetectors and Experimental TechniquesThe APV25 is the 128 channel CMOS chip developed for readout of the silicon microstrip tracker in the CMS experiment at the CERN Large Hadron Collider. The detector is now under construction and will be the largest silicon microstrip system ever built, with ~200m^2 of silicon sensors. Around 10^5 chips are required to instrument the system, which must operate for about 10 years in a high radiation environment with little or no possibility of microstrip system ever built, with ~200m^2 of silicon sensors. Around 10^5 chips are required to instrument the system, which must operate for about 10 years in a high radiation environment with little or no possibility of assurance of long term performance of the readout electronics, especially verification of radiation tolerance, is highly desirable. This has been achieved by means of automated probe testing of every chip on the silicon wafers from the foundry, followed by studies of sample die to evaluate in more detail properties of the chips which cannot easily be examined at the wafer level. During production, it was observed that the yield of good die varied unexpectedly from one production lot to another. This was investigated with significant help from the manufacturer and the process was optimised ensure a consistent high yield. A fraction of the dies, which successfully passed the wafer screening, are subjected to short term X-ray irradiation to levels equivalent to that expected in CMS and annealed. Results are presented here and illustrate the excellent performance of APV25 under all conditions.CERNCMS-NOTE-2004-016oai:cds.cern.ch:7977042004-08-19
spellingShingle Detectors and Experimental Techniques
Barrillon, Pierre
Bainbridge, Robert
Hall, Geoffrey
Leaver, James
Noah, E
Raymond, M
Bisello, Dario
Candelori, Andrea
Kaminski, A
Stefanuti, L
Tessaro, Mario
French, Marcus
Production Testing and Quality Assurance of CMS Silicon Microstrip Tracker Readout Chips
title Production Testing and Quality Assurance of CMS Silicon Microstrip Tracker Readout Chips
title_full Production Testing and Quality Assurance of CMS Silicon Microstrip Tracker Readout Chips
title_fullStr Production Testing and Quality Assurance of CMS Silicon Microstrip Tracker Readout Chips
title_full_unstemmed Production Testing and Quality Assurance of CMS Silicon Microstrip Tracker Readout Chips
title_short Production Testing and Quality Assurance of CMS Silicon Microstrip Tracker Readout Chips
title_sort production testing and quality assurance of cms silicon microstrip tracker readout chips
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.5170/CERN-2004-010.148
http://cds.cern.ch/record/797704
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