Beam-loss-induced electrical stress test on CMS Silicon Strip Modules

Based on simulated LHC beam loss scenarios, fully depleted CMS silicon tracker modules and sensors were exposed to 42 ns-long beam spills of approximately 10**1**1 protons per spill at the PS at CERN. The ionisation dose was sufficient to short circuit the silicon sensors. The dynamic behaviour of b...

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Detalles Bibliográficos
Autores principales: Fahrer, M, Dirkes, G, Hartmann, F, Heier, S, MacPherson, A, Muller, T H, Weiler, T h
Lenguaje:eng
Publicado: 2004
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2003.11.011
http://cds.cern.ch/record/802350

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