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Searching for the origin of VDET pattern recognition errors using the Monte Carlo truth

Detalles Bibliográficos
Autores principales:	Bonissent, A, Carr, J, Drinkard, J
Lenguaje:	eng
Publicado:	1993
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/805897

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