Irradiation qualification of CMS silicon tracker components with protons

The tracking system of the CMS experiment at the LHC collider (CERN) is based on silicon micro-strip detectors. They will be exposed to an equivalent fluence of up to 1.6 multiplied by 10**1**4n (1 MeV)/cm**2 during 10 years of operation. The survival of the sensors in such a radiation environment d...

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Detalles Bibliográficos
Autor principal: Dierlamm, A
Lenguaje:eng
Publicado: 2003
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2003.08.101
http://cds.cern.ch/record/808018
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author Dierlamm, A
author_facet Dierlamm, A
author_sort Dierlamm, A
collection CERN
description The tracking system of the CMS experiment at the LHC collider (CERN) is based on silicon micro-strip detectors. They will be exposed to an equivalent fluence of up to 1.6 multiplied by 10**1**4n (1 MeV)/cm**2 during 10 years of operation. The survival of the sensors in such a radiation environment depends strongly on the sensor design and on the choice of appropriate material. During production we have to verify not only the current quality of the delivered sensors (optical and electronic inspection) but also their radiation hardness. After irradiation to the exposed fluence plus a safety factor, the quality of bulk and surface parameters is verified. Required protocol, measurements and results are presented.
id cern-808018
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2003
record_format invenio
spelling cern-8080182019-09-30T06:29:59Zdoi:10.1016/j.nima.2003.08.101http://cds.cern.ch/record/808018engDierlamm, AIrradiation qualification of CMS silicon tracker components with protonsDetectors and Experimental TechniquesThe tracking system of the CMS experiment at the LHC collider (CERN) is based on silicon micro-strip detectors. They will be exposed to an equivalent fluence of up to 1.6 multiplied by 10**1**4n (1 MeV)/cm**2 during 10 years of operation. The survival of the sensors in such a radiation environment depends strongly on the sensor design and on the choice of appropriate material. During production we have to verify not only the current quality of the delivered sensors (optical and electronic inspection) but also their radiation hardness. After irradiation to the exposed fluence plus a safety factor, the quality of bulk and surface parameters is verified. Required protocol, measurements and results are presented.oai:cds.cern.ch:8080182003
spellingShingle Detectors and Experimental Techniques
Dierlamm, A
Irradiation qualification of CMS silicon tracker components with protons
title Irradiation qualification of CMS silicon tracker components with protons
title_full Irradiation qualification of CMS silicon tracker components with protons
title_fullStr Irradiation qualification of CMS silicon tracker components with protons
title_full_unstemmed Irradiation qualification of CMS silicon tracker components with protons
title_short Irradiation qualification of CMS silicon tracker components with protons
title_sort irradiation qualification of cms silicon tracker components with protons
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2003.08.101
http://cds.cern.ch/record/808018
work_keys_str_mv AT dierlamma irradiationqualificationofcmssilicontrackercomponentswithprotons

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