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Reliability determination of aluminium electrolytic capacitors by the mean of various methods: application to the protection system of the LHC

The lifetime of power electronic components is often calculated from reliability reports, but this method can be discussed. We compare in this article the results of various reliability reports to an accelerated ageing test of component and introduced the load-strength concept. Large aluminium elect...

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Detalles Bibliográficos
Autores principales: Perisse, F, Venet, P, Rojat, G
Lenguaje:eng
Publicado: 2004
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.microrel.2004.07.108
http://cds.cern.ch/record/816583
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author Perisse, F
Venet, P
Rojat, G
author_facet Perisse, F
Venet, P
Rojat, G
author_sort Perisse, F
collection CERN
description The lifetime of power electronic components is often calculated from reliability reports, but this method can be discussed. We compare in this article the results of various reliability reports to an accelerated ageing test of component and introduced the load-strength concept. Large aluminium electrolytic capacitors are taken here in example in the context of the protection system of LHC (Large Hadron Collider) in CERN where the level of reliability is essential. We notice important differences of MTBF (Mean Time Between Failure) according to the reliability report used. Accelerating ageing tests carried out prove that a Weibull law is more adapted to determinate failure rates of components. The load-strength concept associated with accelerated ageing tests can be a solution to determine the lifetime of power electronic components.
id cern-816583
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2004
record_format invenio
spelling cern-8165832019-09-30T06:29:59Zdoi:10.1016/j.microrel.2004.07.108http://cds.cern.ch/record/816583engPerisse, FVenet, PRojat, GReliability determination of aluminium electrolytic capacitors by the mean of various methods: application to the protection system of the LHCEngineeringThe lifetime of power electronic components is often calculated from reliability reports, but this method can be discussed. We compare in this article the results of various reliability reports to an accelerated ageing test of component and introduced the load-strength concept. Large aluminium electrolytic capacitors are taken here in example in the context of the protection system of LHC (Large Hadron Collider) in CERN where the level of reliability is essential. We notice important differences of MTBF (Mean Time Between Failure) according to the reliability report used. Accelerating ageing tests carried out prove that a Weibull law is more adapted to determinate failure rates of components. The load-strength concept associated with accelerated ageing tests can be a solution to determine the lifetime of power electronic components.oai:cds.cern.ch:8165832004
spellingShingle Engineering
Perisse, F
Venet, P
Rojat, G
Reliability determination of aluminium electrolytic capacitors by the mean of various methods: application to the protection system of the LHC
title Reliability determination of aluminium electrolytic capacitors by the mean of various methods: application to the protection system of the LHC
title_full Reliability determination of aluminium electrolytic capacitors by the mean of various methods: application to the protection system of the LHC
title_fullStr Reliability determination of aluminium electrolytic capacitors by the mean of various methods: application to the protection system of the LHC
title_full_unstemmed Reliability determination of aluminium electrolytic capacitors by the mean of various methods: application to the protection system of the LHC
title_short Reliability determination of aluminium electrolytic capacitors by the mean of various methods: application to the protection system of the LHC
title_sort reliability determination of aluminium electrolytic capacitors by the mean of various methods: application to the protection system of the lhc
topic Engineering
url https://dx.doi.org/10.1016/j.microrel.2004.07.108
http://cds.cern.ch/record/816583
work_keys_str_mv AT perissef reliabilitydeterminationofaluminiumelectrolyticcapacitorsbythemeanofvariousmethodsapplicationtotheprotectionsystemofthelhc
AT venetp reliabilitydeterminationofaluminiumelectrolyticcapacitorsbythemeanofvariousmethodsapplicationtotheprotectionsystemofthelhc
AT rojatg reliabilitydeterminationofaluminiumelectrolyticcapacitorsbythemeanofvariousmethodsapplicationtotheprotectionsystemofthelhc