Visualization of heavy ion-induced charge production in a CMOS image sensor

A commercial CMOS image sensor was irradiated with heavy ion beams in the several MeV energy range. The image sensor is equipped with a standard video output. The data were collected on-line through frame grabbing and analysed off-line after digitisation. It was shown that the response of the image...

Descripción completa

Detalles Bibliográficos
Autores principales: Végh, J, Kérek, A, Klamra, W, Molnár, J, Norlin, LO, Novák, D, Sánchez-Crespo, A, Van der Marel, J, Fenyvesi, A, Valastyan, I, Sipos, A
Lenguaje:eng
Publicado: 2004
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2004.03.051
http://cds.cern.ch/record/816803
Descripción
Sumario:A commercial CMOS image sensor was irradiated with heavy ion beams in the several MeV energy range. The image sensor is equipped with a standard video output. The data were collected on-line through frame grabbing and analysed off-line after digitisation. It was shown that the response of the image sensor to the heavy ion bombardment varied with the type and energy of the projectiles. The sensor will be used for the CMS Barrel Muon Alignment system.

Ejemplares similares