Visualization of heavy ion-induced charge production in a CMOS image sensor

A commercial CMOS image sensor was irradiated with heavy ion beams in the several MeV energy range. The image sensor is equipped with a standard video output. The data were collected on-line through frame grabbing and analysed off-line after digitisation. It was shown that the response of the image...

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Detalles Bibliográficos
Autores principales: Végh, J, Kérek, A, Klamra, W, Molnár, J, Norlin, LO, Novák, D, Sánchez-Crespo, A, Van der Marel, J, Fenyvesi, A, Valastyan, I, Sipos, A
Lenguaje:eng
Publicado: 2004
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2004.03.051
http://cds.cern.ch/record/816803

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