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Optical properties of silicon carbide polytypes below and around bandgap
The optical properties of SiC polytypes are discussed with relation to the structure of SiC. The main part of the paper review the detailed measurements of the uniaxial dielectric function below and around the minimum band gap, using phase-modulated spectroscopic ellipsometry, polarised light transm...
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| Lenguaje: | eng |
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2004
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| Acceso en línea: | https://dx.doi.org/10.1016/j.tsf.2003.11.291 http://cds.cern.ch/record/818545 |