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7th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
2007
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/844568 |
_version_ | 1780906752595722240 |
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author | Civinini, Carlo Focardi, Ettore |
author_facet | Civinini, Carlo Focardi, Ettore |
author_sort | Civinini, Carlo |
collection | CERN |
id | cern-844568 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2007 |
record_format | invenio |
spelling | cern-8445682021-07-30T13:16:24Z http://cds.cern.ch/record/844568 eng Civinini, Carlo Focardi, Ettore 7th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors Detectors and Experimental Techniques 2007 |
spellingShingle | Detectors and Experimental Techniques Civinini, Carlo Focardi, Ettore 7th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title | 7th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title_full | 7th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title_fullStr | 7th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title_full_unstemmed | 7th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title_short | 7th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors |
title_sort | 7th international conference on large scale applications and radiation hardness of semiconductor detectors |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/844568 |
work_keys_str_mv | AT civininicarlo 7thinternationalconferenceonlargescaleapplicationsandradiationhardnessofsemiconductordetectors AT focardiettore 7thinternationalconferenceonlargescaleapplicationsandradiationhardnessofsemiconductordetectors |