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Advanced processing and characterization technologies : fabrication and characterization of semiconductor optoelectronic devices and integrated circuits
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
AIP
1991
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/866769 |
_version_ | 1780907454330044416 |
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author | Holloway |
author_facet | Holloway |
author_sort | Holloway |
collection | CERN |
id | cern-866769 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1991 |
publisher | AIP |
record_format | invenio |
spelling | cern-8667692021-04-25T17:25:53Zhttp://cds.cern.ch/record/866769engHollowayAdvanced processing and characterization technologies : fabrication and characterization of semiconductor optoelectronic devices and integrated circuitsXXAIPoai:cds.cern.ch:8667691991 |
spellingShingle | XX Holloway Advanced processing and characterization technologies : fabrication and characterization of semiconductor optoelectronic devices and integrated circuits |
title | Advanced processing and characterization technologies : fabrication and characterization of semiconductor optoelectronic devices and integrated circuits |
title_full | Advanced processing and characterization technologies : fabrication and characterization of semiconductor optoelectronic devices and integrated circuits |
title_fullStr | Advanced processing and characterization technologies : fabrication and characterization of semiconductor optoelectronic devices and integrated circuits |
title_full_unstemmed | Advanced processing and characterization technologies : fabrication and characterization of semiconductor optoelectronic devices and integrated circuits |
title_short | Advanced processing and characterization technologies : fabrication and characterization of semiconductor optoelectronic devices and integrated circuits |
title_sort | advanced processing and characterization technologies : fabrication and characterization of semiconductor optoelectronic devices and integrated circuits |
topic | XX |
url | http://cds.cern.ch/record/866769 |
work_keys_str_mv | AT holloway advancedprocessingandcharacterizationtechnologiesfabricationandcharacterizationofsemiconductoroptoelectronicdevicesandintegratedcircuits |