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Micron-scale smoothing of the Ni/C Multilayer Roughness

Detalles Bibliográficos
Autores principales:	Kovalenko, N V, Mytnichenko, S V, Chernov, V A
Lenguaje:	rus
Publicado:	2002
Materias:	XX
Acceso en línea:	http://cds.cern.ch/record/898071

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