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Microwave electronics: measurement and materials characterization
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
Wiley
2004
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/898828 |
| _version_ | 1780908664573394944 |
|---|---|
| author | Chen, L F |
| author_facet | Chen, L F |
| author_sort | Chen, L F |
| collection | CERN |
| id | cern-898828 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2004 |
| publisher | Wiley |
| record_format | invenio |
| spelling | cern-8988282021-04-22T02:18:29Zhttp://cds.cern.ch/record/898828engChen, L FMicrowave electronics: measurement and materials characterizationEngineeringWileyoai:cds.cern.ch:8988282004 |
| spellingShingle | Engineering Chen, L F Microwave electronics: measurement and materials characterization |
| title | Microwave electronics: measurement and materials characterization |
| title_full | Microwave electronics: measurement and materials characterization |
| title_fullStr | Microwave electronics: measurement and materials characterization |
| title_full_unstemmed | Microwave electronics: measurement and materials characterization |
| title_short | Microwave electronics: measurement and materials characterization |
| title_sort | microwave electronics: measurement and materials characterization |
| topic | Engineering |
| url | http://cds.cern.ch/record/898828 |
| work_keys_str_mv | AT chenlf microwaveelectronicsmeasurementandmaterialscharacterization |