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Advanced experimental methods for noise research in nanoscale electronic devices
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
Kluwer
2005
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/1-4020-2170-4 http://cds.cern.ch/record/898861 |
_version_ | 1780908666323468288 |
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author | Sikula, Josef |
author_facet | Sikula, Josef |
author_sort | Sikula, Josef |
collection | CERN |
id | cern-898861 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2005 |
publisher | Kluwer |
record_format | invenio |
spelling | cern-8988612021-04-22T02:18:23Zdoi:10.1007/1-4020-2170-4http://cds.cern.ch/record/898861engSikula, JosefAdvanced experimental methods for noise research in nanoscale electronic devicesEngineeringKluweroai:cds.cern.ch:8988612005 |
spellingShingle | Engineering Sikula, Josef Advanced experimental methods for noise research in nanoscale electronic devices |
title | Advanced experimental methods for noise research in nanoscale electronic devices |
title_full | Advanced experimental methods for noise research in nanoscale electronic devices |
title_fullStr | Advanced experimental methods for noise research in nanoscale electronic devices |
title_full_unstemmed | Advanced experimental methods for noise research in nanoscale electronic devices |
title_short | Advanced experimental methods for noise research in nanoscale electronic devices |
title_sort | advanced experimental methods for noise research in nanoscale electronic devices |
topic | Engineering |
url | https://dx.doi.org/10.1007/1-4020-2170-4 http://cds.cern.ch/record/898861 |
work_keys_str_mv | AT sikulajosef advancedexperimentalmethodsfornoiseresearchinnanoscaleelectronicdevices |