Cargando…
A measurement of the Lorentz angle in silicon strip sensors at cryogenic temperature
A geometric model of charge collection has been developed to measure the Lorentz angle in silicon sensors. The model relates the track inclination to the average cluster width. A Lorentz angle of 19.6 plus or minus 0.27-0.5+1.0 degree was measured by fitting the model to cosmic ray data collected wi...
Autores principales: | Johnson, I, Amsler, C, Chiochia, V, Dorokhov, A, Pruys, H S, Regenfus, C, Rochet, J |
---|---|
Lenguaje: | eng |
Publicado: |
2005
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2004.11.019 http://cds.cern.ch/record/903026 |
Ejemplares similares
-
A cryogenic silicon micro-strip and pure-CsI detector for detection of antihydrogen annihilations
por: Regenfus, C
Publicado: (2003) -
Collected Charge and Lorentz Angle Measurement on Non-irradiated and Irradiated ATLAS Silicon Micro-Strip Sensors for the HL-LHC
por: Yildirim, Eda
Publicado: (2017) -
Detection of antihydrogen annihilations with a cryogenic pure-CsI crystal detector
por: Regenfus, C, et al.
Publicado: (2003) -
An algorithm for calculating the Lorentz angle in silicon detectors
por: Bartsch, V., et al.
Publicado: (2002) -
A Measurement of Lorentz Angle and Spatial Resolution of Radiation Hard Silicon Pixel Sensors
por: Gorelov, I, et al.
Publicado: (2001)