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ILC Compatibility with Possible Multi-TeV Upgrade

A large number of critical design decisions for ILC will have to be taken in the near future. Some of these decisions, especially those related to civil engineering are strongly related to the capability of reusing the ILC tunnel for a future multi-TeV upgrade based on CLIC technology. This note dis...

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Detalles Bibliográficos
Autores principales: Braun, Hans Heinrich, Delahaye, Jean Pierre, Schulte, Daniel
Lenguaje:eng
Publicado: 2005
Materias:
Acceso en línea:http://cds.cern.ch/record/903844

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