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ILC Compatibility with Possible Multi-TeV Upgrade
A large number of critical design decisions for ILC will have to be taken in the near future. Some of these decisions, especially those related to civil engineering are strongly related to the capability of reusing the ILC tunnel for a future multi-TeV upgrade based on CLIC technology. This note dis...
Autores principales: | Braun, Hans Heinrich, Delahaye, Jean Pierre, Schulte, Daniel |
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Lenguaje: | eng |
Publicado: |
2005
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/903844 |
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