Particle detectors made of high-resistivity Czochralski silicon

We have processed pin-diodes and strip detectors on n- and p-type high-resistivity silicon wafers grown by magnetic Czochralski method. The Czochralski silicon (Cz-Si) wafers manufactured by Okmetic Oyj have nominal resistivity of 900 Omega cm and 1.9 kOmega cm for n- and p-type, respectively. The o...

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Detalles Bibliográficos
Autores principales: Härkönen, J, Eremin, V, Ivanov, A, Li, Z, Luukka, Panja, Pirojenko, A, Riihimaki, I, Tuominen, E, Tuovinen, E, Verbitskaya, E, Virtanen, A
Lenguaje:eng
Publicado: 2005
Materias:
Health Physics and Radiation Effects
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2005.01.057
http://cds.cern.ch/record/908847

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