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Radiation tests of CMS RPC muon trigger electronic components
The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were al...
| Autores principales: | , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2005
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2004.08.113 http://cds.cern.ch/record/908857 |
| _version_ | 1780908840136474624 |
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| author | Bunkowski, Karol Kassamakov, Ivan Kierzkowski, Krzysztof Królikowski, J Kudla, MacIej Maenpaa, Teppo Pozniak, Krzysztof T Rybka, Dominik Tuominen, Eija Ungaro, Donatella Wrochna, Grzegorz Zabolotny, W M |
| author_facet | Bunkowski, Karol Kassamakov, Ivan Kierzkowski, Krzysztof Królikowski, J Kudla, MacIej Maenpaa, Teppo Pozniak, Krzysztof T Rybka, Dominik Tuominen, Eija Ungaro, Donatella Wrochna, Grzegorz Zabolotny, W M |
| author_sort | Bunkowski, Karol |
| collection | CERN |
| description | The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured. |
| id | cern-908857 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2005 |
| record_format | invenio |
| spelling | cern-9088572019-09-30T06:29:59Zdoi:10.1016/j.nima.2004.08.113http://cds.cern.ch/record/908857engBunkowski, KarolKassamakov, IvanKierzkowski, KrzysztofKrólikowski, JKudla, MacIejMaenpaa, TeppoPozniak, Krzysztof TRybka, DominikTuominen, EijaUngaro, DonatellaWrochna, GrzegorzZabolotny, W MRadiation tests of CMS RPC muon trigger electronic componentsHealth Physics and Radiation EffectsThe results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured.oai:cds.cern.ch:9088572005 |
| spellingShingle | Health Physics and Radiation Effects Bunkowski, Karol Kassamakov, Ivan Kierzkowski, Krzysztof Królikowski, J Kudla, MacIej Maenpaa, Teppo Pozniak, Krzysztof T Rybka, Dominik Tuominen, Eija Ungaro, Donatella Wrochna, Grzegorz Zabolotny, W M Radiation tests of CMS RPC muon trigger electronic components |
| title | Radiation tests of CMS RPC muon trigger electronic components |
| title_full | Radiation tests of CMS RPC muon trigger electronic components |
| title_fullStr | Radiation tests of CMS RPC muon trigger electronic components |
| title_full_unstemmed | Radiation tests of CMS RPC muon trigger electronic components |
| title_short | Radiation tests of CMS RPC muon trigger electronic components |
| title_sort | radiation tests of cms rpc muon trigger electronic components |
| topic | Health Physics and Radiation Effects |
| url | https://dx.doi.org/10.1016/j.nima.2004.08.113 http://cds.cern.ch/record/908857 |
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