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Radiation tests of CMS RPC muon trigger electronic components
The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were al...
| Autores principales: | , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2005
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2004.08.113 http://cds.cern.ch/record/908857 |