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TID and SEU performance of a commercial 013 $\mu$ m CMOS technology
The radiation tolerance of a commercial 0.13 mu m CMOS technology is investigated. Total ionizing dose (TID) effects, on individual transistors, are evaluated up to 30 Mrd. Single event upset (SEU) sensitivity has been measured on a SRAM with a proton beam.
| Autores principales: | , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2004
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/909100 |
| _version_ | 1780908869537497088 |
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| author | Hänsler, Kurt Anelli, G Baldi, S Faccio, F Hajdas, W Marchioro, A |
| author_facet | Hänsler, Kurt Anelli, G Baldi, S Faccio, F Hajdas, W Marchioro, A |
| author_sort | Hänsler, Kurt |
| collection | CERN |
| description | The radiation tolerance of a commercial 0.13 mu m CMOS technology is investigated. Total ionizing dose (TID) effects, on individual transistors, are evaluated up to 30 Mrd. Single event upset (SEU) sensitivity has been measured on a SRAM with a proton beam. |
| id | cern-909100 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2004 |
| record_format | invenio |
| spelling | cern-9091002019-09-30T06:29:59Zhttp://cds.cern.ch/record/909100engHänsler, KurtAnelli, GBaldi, SFaccio, FHajdas, WMarchioro, ATID and SEU performance of a commercial 013 $\mu$ m CMOS technologyHealth Physics and Radiation EffectsThe radiation tolerance of a commercial 0.13 mu m CMOS technology is investigated. Total ionizing dose (TID) effects, on individual transistors, are evaluated up to 30 Mrd. Single event upset (SEU) sensitivity has been measured on a SRAM with a proton beam.oai:cds.cern.ch:9091002004 |
| spellingShingle | Health Physics and Radiation Effects Hänsler, Kurt Anelli, G Baldi, S Faccio, F Hajdas, W Marchioro, A TID and SEU performance of a commercial 013 $\mu$ m CMOS technology |
| title | TID and SEU performance of a commercial 013 $\mu$ m CMOS technology |
| title_full | TID and SEU performance of a commercial 013 $\mu$ m CMOS technology |
| title_fullStr | TID and SEU performance of a commercial 013 $\mu$ m CMOS technology |
| title_full_unstemmed | TID and SEU performance of a commercial 013 $\mu$ m CMOS technology |
| title_short | TID and SEU performance of a commercial 013 $\mu$ m CMOS technology |
| title_sort | tid and seu performance of a commercial 013 $\mu$ m cmos technology |
| topic | Health Physics and Radiation Effects |
| url | http://cds.cern.ch/record/909100 |
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