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TID and SEU performance of a commercial 013 $\mu$ m CMOS technology
The radiation tolerance of a commercial 0.13 mu m CMOS technology is investigated. Total ionizing dose (TID) effects, on individual transistors, are evaluated up to 30 Mrd. Single event upset (SEU) sensitivity has been measured on a SRAM with a proton beam.
Autores principales: | , , , , , |
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Lenguaje: | eng |
Publicado: |
2004
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/909100 |