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CMOS Technology Characterization for analog/RF application
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
CERN
2005
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.5170/CERN-2005-011.33 http://cds.cern.ch/record/920017 |
| _version_ | 1780909289482747904 |
|---|---|
| author | Seebacher, Ehrenfried |
| author_facet | Seebacher, Ehrenfried |
| author_sort | Seebacher, Ehrenfried |
| collection | CERN |
| id | cern-920017 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2005 |
| publisher | CERN |
| record_format | invenio |
| spelling | cern-9200172019-09-30T06:29:59Zdoi:10.5170/CERN-2005-011.33http://cds.cern.ch/record/920017engSeebacher, EhrenfriedCMOS Technology Characterization for analog/RF applicationDetectors and Experimental TechniquesCERNoai:cds.cern.ch:9200172005 |
| spellingShingle | Detectors and Experimental Techniques Seebacher, Ehrenfried CMOS Technology Characterization for analog/RF application |
| title | CMOS Technology Characterization for analog/RF application |
| title_full | CMOS Technology Characterization for analog/RF application |
| title_fullStr | CMOS Technology Characterization for analog/RF application |
| title_full_unstemmed | CMOS Technology Characterization for analog/RF application |
| title_short | CMOS Technology Characterization for analog/RF application |
| title_sort | cmos technology characterization for analog/rf application |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.5170/CERN-2005-011.33 http://cds.cern.ch/record/920017 |
| work_keys_str_mv | AT seebacherehrenfried cmostechnologycharacterizationforanalogrfapplication |